Yan Ge

Dr. Yan Ge is a senior scientist in the research and modeling group on the extreme event solutions team at Verisk. She focuses on modeling how natural hazards affect agriculture and crop insurance programs and is involved in developing and improving the Verisk Multiple Peril Crop Insurance models for Canada and China. Prior to Verisk, Yan worked for the University of Illinois at Urbana-Champaign as a research assistant in climate change detection, impact assessment of climate change on crop yields, and analysis of climate extremes. She earned a PhD and an MS in environmental hydrology and hydraulic engineering from the University of Illinois at Urbana-Champaign.paign.

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